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News center
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Contact us
Our Products
FTIR Product Series
SICD Product Series
SICV Product Series
SICE Product Series
SATVision
LSR Vision
Eos2001m1u1fi5
4/5/6/8-inch compatible silicon-based epitaxial layer thickness measurement
Eos300+
12 inch element and epitaxial film thickness measurement automatic equipment
Eos200DSR
Fully automatic reflective optical film thickness measurement equipment
Eos300T
12 inch carbon oxygen concentration measurement equipment
Eos200s
Semi-automatic 4/5/6/8 inch compatible epitaxial layer film thickness measurement equipment
Eos300s
Semi-automatic 12-inch epitaxial layer film thickness measurement equipment
SICD200s
Semi automatic detection equipment for dislocations and micro tube defects in SiC substrate wafers
SATVision G1
Fully automatic ultrasonic defect detection equipment
LSR Vision 8528
Wafer surface defect inspection equipment
SATVision G1-S
Semi-automatic ultrasonic defect detection equipment
SICD200
Fully automatic detection equipment for dislocations and micro tube defects in SiC substrate wafers 润色译文 笔记
SICE200
Fully automated wafer edge inspection equipment
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Company Address
Room 402, Building 1, No.570, Shengxia Road, Shanghai, China
Contact Details
Market and Sales: sales@avantsemi.com.cn
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Service email: service@avantsemi.com.cn
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