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CN
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EN
Home
About Avantsemi
Our Products
News center
Company News
Technical Information
Careers
Company culture
Corporate recruitment
Contact us
Our Products
FTIR Product Series
SICD Product Series
SICV Product Series
SICE Product Series
Eos200
4/5/6/8-inch compatible silicon-based epitaxial layer thickness measurement
Eos200lite
4/5/6/8 inch compatible with SiC epitaxial layer film thickness measurement
Eos300+
12 inch element and epitaxial film thickness measurement automatic equipment
Eos200DSR
Fully automatic reflective optical film thickness measurement equipment
SICD200
Fully automatic detection equipment for dislocations and micro tube defects in SiC substrate wafers 润色译文 笔记
SICE200
Fully automated wafer edge inspection equipment
SICV200
Wafer resistivity measurement equipment
SICD200s
Semi automatic detection equipment for dislocations and micro tube defects in SiC substrate wafers
About Avantsemi
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Our Products
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News center
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Careers
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Contact us
Company Address
Room 402, Building 1, No.570, Shengxia Road, Shanghai, China
Contact Details
Market and Sales: sales@avantsemi.com.cn
Job recruitment: talent@avantsemi.com.cn
Service email: service@avantsemi.com.cn
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