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SATVision G1-S Semi-automatic ultrasonic defect detection equipment
SATVision G1-S is a semi-automatic ultrasonic defect detection device developed by Yuruipu for bonded wafers
SATVision G1-S Description
  • Compatible with 4/6/8/12 inch bonded wafers

  • Manual picking and placing, automatic loading of wafers, automatic
    scanning and processing of resultsEquipped with a single probe
  • Optional functions include automatic drying, automatic leveling, and automatic removal of bubbles


Advantage

  • The upper and lower pieces are simple and have the characteristics of repeated positioning;

  • Automatically remove possible air bubbles on and below the sample and at the end of the probe;

  • Automatic leveling of the sample, easy to operate. The sample is automatically  dried at the end of the day;

  • Company Address
    Room 402, Building 1, No.570, Shengxia Road, Shanghai, China
  • Contact Details
    Market and Sales: sales@avantsemi.com.cn
    Job recruitment: talent@avantsemi.com.cn
    Service email: service@avantsemi.com.cn
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